@ARTICLE{Bochenek_D._Technology_2018, author={Bochenek, D. and Osińska, K. and Niemiec, P. and Adamczyk, M. and Goryczka, T. and Szych, R.}, volume={vol. 63}, number={No 3}, journal={Archives of Metallurgy and Materials}, pages={1401-1409}, howpublished={online}, year={2018}, publisher={Institute of Metallurgy and Materials Science of Polish Academy of Sciences}, publisher={Committee of Materials Engineering and Metallurgy of Polish Academy of Sciences}, abstract={In the work five ceramic compounds based on the (K0.44Na0.52Li0.04)NbO3 (KNLN) material modified with oxides: Cr2O3, ZnO, Sb2O3 or Fe2O3 (in an amount of 0.5 mol.%) were obtained. The KNLN-type composition powder was prepared by solid phase synthesis from a mixture of simple oxides and carbonates, while compacted of the ceramic samples was conducted by free sintering methods. In the work the effect of the used admixture on the electrophysical properties of the KNLN ceramics was presented. The XRD, EDS tests, the SEM measurements of the morphology ceramic samples, dielectric properties and DC electric conductivity were conducted. The research showed that the used admixtures introduced into the base of KNLN-type composition improve the microstructure of the ceramic samples and improve their sinterability. In the case of the dielectric measurements, it was observed a decrease in the maximum dielectric permittivity at the TC for dopred KNLN-type samples. The addition of an admixture of chromium, zinc, antimony or iron in an amount of 0.5 mol.% to the base composition (K0.44Na0.52Li0.04)NbO3 practically does not change the phase transition temperature. The diminution in the density value of doped KNLN ceramics was attributed to the alkali elements volatilization.}, type={Artykuły / Articles}, title={Technology and Electrophysical Properties of the (K0.44Na0.52Li0.04) NbO3 Ceramics Doped by Cr3+, Zn2+, Sb3+ or Fe3+}, URL={http://www.journals.pan.pl/Content/108021/PDF/AMM-2018-3-41-Bochenek.pdf}, doi={10.24425/123818}, keywords={lead free ceramics, KNLN ceramics, SEM microstructure, dielectric tests}, }