TY - JOUR N2 - Graphene is a very promising material for potential applications in many fields. Since manufacturing technologies of graphene are still at the developing stage, low-frequency noise measurements as a tool for evaluating their quality is proposed. In this work, noise properties of polymer thick-film resistors with graphene nano-platelets as a functional phase are reported. The measurements were carried out in room temperature. 1/f noise caused by resistance fluctuations has been found to be the main component in the specimens. The parameter values describing noise intensity of the polymer thick-film specimens have been calculated and compared with the values obtained for other thick-film resistors and layers used in microelectronics. The studied polymer thick-film specimens exhibit rather poor noise properties, especially for the layers with a low content of the functional phase. L1 - http://www.journals.pan.pl/Content/106330/PDF/10.1515-mms-2017-0051-paper%2001.pdf L2 - http://www.journals.pan.pl/Content/106330 PY - 2017 IS - No 4 EP - 585–590 DO - 10.1515/mms-2017-0051 KW - graphene KW - polymer thick-film resistor KW - low-frequency noise KW - noise measurements A1 - Mleczko, Krzysztof A1 - Ptak, Piotr A1 - Zawiślak, Zbigniew A1 - Słoma, Marcin A1 - Jakubowska, Małgorzata A1 - Kolek, Andrzej PB - Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation VL - vol. 24 DA - 2017.12.15 T1 - Noise Properties of Graphene-Polymer Thick-Film Resistors SP - 585–590 UR - http://www.journals.pan.pl/dlibra/publication/edition/106330 T2 - Metrology and Measurement Systems ER -