TY - JOUR N2 - The research on the coupling electromagnetic effect was studied in this paper, in consideration of the wreaking damage of the powerful electromagnetic pulse to the electronic products. The characteristic of the metallic via and stub interconnect with the coupling voltage was calculated by the model, which was the transfer function F( f ) of the protection circuit parameters of DC power source. The research showed that: the smaller radius of Metallic via, the lower amplitude of F( f ), the less energy of a power electro- magnetic pulse (PEP); the higher increase of the width of the stub interconnect, the bigger reduction of the characteristic impedance of plane wave coupling, the depth of the notch band significantly narrowed. The simulations and experiments were done to compare the protection effects of protection circuits with different parameters at last. The results showed that the protection circuit designed could be highly advantageous in protecting the DC power source in this article. L1 - http://www.journals.pan.pl/Content/107883/PDF/AEE-67-3-2018-10.09_art_16.pdf L2 - http://www.journals.pan.pl/Content/107883 PY - 2018 IS - No 3 EP - 683–694 DO - 10.24425/123672 KW - powerful electromagnetic pulse (PEP) KW - metallic via KW - stub interconnect KW - coupling characteristics KW - electromagnetic effect A1 - Xiaofei Xu A1 - Li, Denghua A1 - Shuhui Yang PB - Polish Academy of Sciences VL - vol. 67 DA - 2018.09.13 T1 - Research on the characteristics of the PEP coupling into a metallic via and stub interconnect SP - 683–694 UR - http://www.journals.pan.pl/dlibra/publication/edition/107883 T2 - Archives of Electrical Engineering ER -