TY - JOUR N2 - The paper presents a method of obtaining short-termpositioning accuracy based on micro electro-mechanical system (MEMS) sensors and analysis of the results. A high-accuracy and fast-positioning algorithm must be included due to the high risk of accidents in cities in the future, especially when autonomous objects are taken into account. High-level positioning systems should consider a number of sub-systems such as global positioning system (GPS), CCTV – video analysis, a system based on analysis of signal strength of access points (AP), etc. Short-term positioning means that there are other locating systems with a sufficiently high degree of accuracy based on, e.g. a video camera, but the located object can disappear when it is hidden by other objects, e.g. people, things, shelves etc. In such a case, MEMS sensors can be employed as a positioning system. The paper examines typical movement profiles of a radio-controlled (RC) model and fundamental filtering methods in respect of position accuracy. The authors evaluate the complexity and delay of the filter and the accuracy of the positioning in respect of the current speed and phase of movement (positive acceleration, constant) of the object. It is necessary to know whether and how the length of the filter changes the position accuracy. It has been shown that the use of fundamental filters, which provide solutions in a short time, enables to locate objects with a small error in a limited time. L1 - http://www.journals.pan.pl/Content/110238/PDF/art_09.pdf L2 - http://www.journals.pan.pl/Content/110238 PY - 2019 IS - No 1 EP - 107 DO - 10.24425/mms.2019.126325 KW - electro-mechanical system KW - received signal strength indicator KW - positioning KW - filtering A1 - Grzechca, Damian A1 - Paszek, Krzysztof PB - Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation VL - vol. 26 DA - 2019.04.01 T1 - Short-term positioning accuracy based on mems sensors for smart city solutions SP - 95 UR - http://www.journals.pan.pl/dlibra/publication/edition/110238 T2 - Metrology and Measurement Systems ER -