TY - JOUR N2 - There exists a need in a quality and accuracy of a three-dimensional laser metrology operating in numerically controlled automatic machines. For this purpose, one sends three laser beams mutually perpendicular. These three beams of the wavelength λ = 0.6328 μm are generated by the same laser and are directed along three independent, orthogonal, mutually perpendicular, optical paths with a given light polarization plain. Using these beams, constituting the frame of coordinates, three independent laser rangefinders are able to determine spatial coordinates of a working tool or a workpiece. To form these optical pulses, a special refractive index matched Half-Wave Plate with nematic Liquid Crystal (LCHWP) was applied. The presented half-wave plate is based on a single Twisted Nematic (TN) cell (with the twist angle Φ = π/2) of a rather high cell gap d ~15 μm filled with a newly developed High-Birefringence Nematic Liquid Crystal Mixture (HBLCM) of optical anisotropy as high as Δn ~0.40 at λ = 0.6328 μm, where the Mauguin limit above 5.00 ~ Δnd >> λ/2 = 0.32 is fulfilled. L1 - http://www.journals.pan.pl/Content/116104/PDF/Opto2016_22.pdf L2 - http://www.journals.pan.pl/Content/116104 PY - 2016 IS - No 4 EP - 182 KW - liquid crystal KW - half-wave plate KW - twisted nematic KW - laser metrology A1 - Piecek, W. A1 - Jaroszewicz, L.R. A1 - Miszczyk, E. A1 - Raszewski, Z. A1 - Mrukiewicz, M. A1 - Perkowski, P. A1 - Nowinowski-Kruszelnicki, E. A1 - Zieliński, J. A1 - Olifierczuk, M. A1 - Kędzierski, J. A1 - Sun, X.W. A1 - Garbat, K. A1 - Kowiorski, K. A1 - Morawiak, P. A1 - Mazur, R. A1 - Tkaczyk, J. PB - Polish Academy of Sciences (under the auspices of the Committee on Electronics and Telecommunication) and Association of Polish Electrical Engineers in cooperation with Military University of Technology VL - vol. 24 DA - 17.10.2016 T1 - Refractive index matched half-wave plate with a nematic liquid crystal for three-dimensional laser metrology applications SP - 169 UR - http://www.journals.pan.pl/dlibra/publication/edition/116104 T2 - Opto-Electronics Review ER -