TY - JOUR N2 - A novel laser diode based length measuring interferometer for scientific and industrial metrology is presented. Wavelength the stabilization system applied in the interferometer is based on the optical wedge interferometer. Main components of the interferometer such as: laser diode stabilization assembly, photodetection system, measuring software, air parameters compensator and base optical assemblies are described. Metrological properties of the device such as resolution, measuring range, repeatability and accuracy are characterized. L1 - http://www.journals.pan.pl/Content/89972/PDF/Journal10178-VolumeXIXIssue3_12.pdf L2 - http://www.journals.pan.pl/Content/89972 PY - 2012 IS - No 3 EP - 564 DO - 10.2478/v10178-012-0048-1 KW - diode laser KW - wavelength stabilization KW - interferometer KW - interferometer distance measurement. A1 - Dobosz, Marek PB - Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation DA - 2012 T1 - Laser diode distance measuring interferometer - metrological properties SP - 553 UR - http://www.journals.pan.pl/dlibra/publication/edition/89972 T2 - Metrology and Measurement Systems ER -