Details

Title

Advanced Real-time Evaluation and Data Quality Monitoring Model Integration with FPGAs for Tokamak High-performance Soft X-ray Diagnostic System

Journal title

International Journal of Electronics and Telecommunications

Yearbook

2018

Volume

vol. 64

Issue

No 4

Authors

Keywords

data quality monitoring ; system modeling ; FPGA ; Verilog/VHDL ; HDL ; GEM detector ; SXR plasma diagnostics ; modular measurement system ; data evaluation

Divisions of PAS

Nauki Techniczne

Coverage

473-479

Publisher

Polish Academy of Sciences Committee of Electronics and Telecommunications

Date

2018.11.15

Type

Artykuły / Articles

Identifier

DOI: 10.24425/123548 ; eISSN 2300-1933 (since 2013) ; ISSN 2081-8491 (until 2012)

Source

International Journal of Electronics and Telecommunications; 2018; vol. 64; No 4; 473-479
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