Details

Title

Distribution of potential barrier height local values at Al-SiO2 and Si-SiO2 interfaces of the metal-oxide-semiconductor structures

Journal title

Bulletin of the Polish Academy of Sciences Technical Sciences

Yearbook

2006

Volume

vol. 54

Issue

No 4

Authors

Keywords

barrier height ; effective contact potential difference ; MOS system

Divisions of PAS

Nauki Techniczne

Coverage

461-468

Date

2006

Type

Artykuły / Articles

Identifier

ISSN 2300-1917

Source

Bulletin of the Polish Academy of Sciences: Technical Sciences; 2006; vol. 54; No 4; 461-468
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