Ultrasonic assisted active-passive filling friction stir repairing (A-PFFSR) was proposed to repair volume defects in the metallic parts. Sound joints without interfacial defects could be achieved. Firstly, the ultrasonic was beneficial to improving material flow and atom diffusion, and then eliminated kissing bond defects compared to conventional A-PFFSR joints. Secondly, the equiaxed grains were refined by ultrasonic vibration. Lastly, the repairing passes were reduced due to the ultrasonic, which decreased softening degree of the repaired joints. The maximum tensile strength of 150 MPa was achieved. Therefore, this strategy to repair the volume defects is feasibility and potential in the remanufacturing fields of aerospace and transportation.
This paper is an analysis of determination possibility of the optical absorption coefficient spectra of thin semiconductor layers from their normalized photoacoustic amplitude spectra. Influence of multiple reflections of light in thin layers on their photoacoustic and optical absorption coefficient spectra is presented and discussed in detail. Practical formulae for the optical absorption coefficient spectrum as a function of the normalized photoacoustic amplitude spectrum are derived and presented. Next, they were applied for computations of the optical absorption coefficient spectra of thin In2S3 thin layers deposited on a glass substrate. This method was experimentally verified with the optical transmission method.
The propagation of EEG activity during the Continuous Attention Test (CAT) was determined by means of Short-time Directed Transfer Function (SDTF). SDTF supplied the information on the direction, spectral content and time evolution of the propagating EEG activity. The differences in propagation for target and non-target conditions were found mainly in the frontal structures of the brain.