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Abstract

A developed method and measurement setup for measurement of noise generated in a supercapacitor is presented. The requirements for noise data recording are considered and correlated with working modes of supercapacitors. An example of results of low-frequency noise measurements in commercially available supercapacitors are presented. The ability of flicker noise measurements suggests that they can be used to assess quality of tested supercapacitors.

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Authors and Affiliations

Arkadiusz Szewczyk

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