TY - JOUR N2 - High-speed serial standards are rapidly developing, and with a requirement for effective compliance and characterization measurement methods. Jitter decomposition consists in troubleshooting steps based on jitter components from decomposition results. In order to verify algorithms with different deterministic jitter (DJ) in actual circuits, jitter generation model by cross-point calibration and timing modulation for jitter decomposition is presented in this paper. The generated jitter is pre-processed by cross-point calibration which improves the accuracy of jitter generation. Precisely controllable DJ and random jitter (RJ) are generated by timing modulation such as data-dependent jitter (DDJ), duty cycle distortion (DCD), bounded uncorrelated jitter (BUJ), and period jitter (PJ). The benefit of the cross-point calibration was verified by comparing generation of controllable jitter with and without cross-point calibration. The accuracy and advantage of the proposed method were demonstrated by comparing with the method of jitter generation by analog modulation. Then, the validity of the proposed method was demonstrated by hardware experiments where the jitter frequency had an accuracy of 20 ppm, the jitter amplitude ranged from 10 ps to 8.33 ns, a step of 2 ps or 10 ps, and jitter amplitude was independent of jitter frequency and data rate. L1 - http://www.journals.pan.pl/Content/118922/PDF/art08.pdf L2 - http://www.journals.pan.pl/Content/118922 PY - 2021 IS - No 1 EP - 143 DO - 10.24425/mms.2021.135993 KW - jitter decomposition KW - jitter generation KW - cross-point calibration KW - timing modulation KW - deterministic jitter KW - random jitter A1 - Ren, Nan A1 - Fu, Zaiming A1 - Lei, Shengcun A1 - Liu, Hanglin A1 - Tian, Shulin PB - Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation VL - vol. 28 DA - 2021.03.31 T1 - Jitter generation model based on timing modulation and cross point calibration for jitter decomposition SP - 123 UR - http://www.journals.pan.pl/dlibra/publication/edition/118922 T2 - Metrology and Measurement Systems ER -