Title

Stimulus with Limited Band Optimization for Analogue Circuit Testing

Journal title

Metrology and Measurement Systems

Yearbook

2012

Issue

No 1

Authors

Golonek, Tomasz ; Jantos, Piotr ; Rutkowski, Jerzy

Keywords

analogue circuit testing ; faults isolation ; evolutionary computations ; amplitude spectrum

Divisions of PAS

Nauki Techniczne

Coverage

73-84

Publisher

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Date

2012

Type

Artykuły / Articles

Identifier

DOI: 10.2478/v10178-012-0006-y ; ISSN 2080-9050, e-ISSN 2300-1941

Source

Metrology and Measurement Systems; 2012; No 1; 73-84

References

Milor L. (1998), A Tutorial Introduction to Research on Analog and Mixed-Signal Circuit Testing, IEEE Trans. on Cir. and Syst.-II, Analog and Digital Signals Processing, 45, 10, 1389, doi.org/10.1109/82.728852 ; Załęski D. (2010), Application of Complementary Signals in Built-In Self Testers for Mixed-Signal Embedded Electronic Systems, IEEE Trans. on Inst. and Measure, 59, 2, 345, doi.org/10.1109/TIM.2009.2023819 ; Tadeusiewicz M. (2009), Multiple catastrophic fault diagnosis of linear circuits considering the component tolerances, In Proc. ECCTD, 647. ; Bartosiński B. (2003), Some methods of diagnosis of analog circuits using mixed signal test bus IEEE 1149.4, Metrology and Measurement Systems, 10, 2, 157. ; Chalk C. (1997), A Design for Test Technique to Increase the Resolution of Analogue Supply Current Tests, Electronic Letters, 33, 21, doi.org/10.1049/el:19971174 ; Jantos P. (2011), An Analogue Electronic Circuits Specification Driven Testing with the use of Time Domain Response's Features, null. ; Jantos P. (2009), Global Parametric Faults Identification in Analogue Electronic Circuits, Metrology and Measurement Systems, 16, 3, 391. ; Alippi C. (2005), Automated Selection of Test Frequencies for Fault Diagnosis in Analog Electronic Circuits, IEEE Trans. On Instr. and Measur, 54, 3. ; Tadeusiewicz M. (2010), A method for fast simulation of multiple catastrophic faults in analogue circuits, International Journal of Circuit Theory and Applications, 38, 3, 275. ; Jantos P. (2010), An analogue integrated circuits yield optimisation with the use of genetic algorithm, null, 293. ; Korzybski M. (2008), Dictionary method for multiple soft and catastrophic fault diagnosis based on evolutionary computation, null, 553. ; Golonek T. (2007), Genetic-Algorithm-Based Method for Optimal Analog Test Points Selection, IEEE Trans. on Cir. and Syst.-II, 54, 2, 117, doi.org/10.1109/TCSII.2006.884112 ; Golonek T. (2011), The Use of Stimulus with Limited Band for Analogue Circuit Testing, null, 884. ; Grzechca D. (2011), Soft Fault Clustering in Analog Electronic Circuits with the Use of Self Organizing Neural Network, Metrology and Measurement Systems, 18, 4, 555, doi.org/10.2478/v10178-011-0054-8 ; Pułka A. (2011), Two Heuristic Algorithms for Test Point Selection in Analog Circuits Diagnoses, Metrology and Measurement Systems, 18, 1, 115, doi.org/10.2478/v10178-011-0011-6 ; Price K. (2005), Differential Evolution - A Practical Approach to Global Optimization. ; Goldberg D. (1989), Genetic Algorithms in Search / Optimization and Machine Learning. ; Michalewicz Z. (1996), Genetic Algorithms+Data Structures=Evolution Programs, doi.org/10.1007/978-3-662-03315-9 ; Koza J. (1992), Genetic Programming: on the programming of computers by means of natural selection. ; UAF42 design software. <a target="_blank" href='http://focus.ti.com/docs/prod/folders/print/uaf42.html'>http://focus.ti.com/docs/prod/folders/print/uaf42.html</a>