Tytuł artykułu

A probabilistic approach for approximation of optical and opto-electronic properties of an opto-semiconductor wafer under consideration of measuring inaccuracy and model uncertainty

Tytuł czasopisma

Opto-Electronics Review

Rocznik

2023

Wolumin

31

Numer

2

Autorzy

Stroka, Stefan M. ; Heumann, Christian ; Suhrke, Fabian ; Meindl, Kathrin

Afiliacje

Stroka, Stefan M. : Department of Statistics, Faculty of Mathematics, Informatics and Statistics, LMU Munich, 80539 Munich, Germany ; Stroka, Stefan M. : ams-OSRAM International GmbH, 93055 Regensburg, Germany ; Heumann, Christian : Department of Statistics, Faculty of Mathematics, Informatics and Statistics, LMU Munich, 80539 Munich, Germany ; Suhrke, Fabian : ams-OSRAM International GmbH, 93055 Regensburg, Germany ; Meindl, Kathrin : ams-OSRAM International GmbH, 93055 Regensburg, Germany

Słowa kluczowe

Gaussian process regression ; machine learning ; uncertainty quantification ; photoluminescence ; opto-semiconductor wafer measuring

Wydział PAN

Nauki Techniczne

Zakres

e145863

Wydawca

Polish Academy of Sciences (under the auspices of the Committee on Electronics and Telecommunication) and Association of Polish Electrical Engineers in cooperation with Military University of Technology

Data

12.05.2023

Typ

Article

Identyfikator

DOI: 10.24425/opelre.2023.145863 ; ISSN 1896-3757

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