Stadler, Adam Witold
Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation
Mleczko, Krzysztof
Artykuły / Articles
Nauki Techniczne
low-frequency noise
thick-film inductor
ISSN 2080-9050, e-ISSN 2300-1941
Noise Properties Of Thick-Film Conducting Lines For Integrated Inductors
Zawiślak, Zbigniew
Kolek, Andrzej
Metrology and Measurement Systems; 2015; vol. 22; No 2; 229-240
Nowak, Damian
Dziedzic, Andrzej
thick-film conducting layer