Details Details PDF BIBTEX RIS Title Influence of spectral characteristics of radiation on the accuracy of optical coherence tomography (OCT) using a laser-plasma source of soft X-rays and extreme ultraviolet Journal title Metrology and Measurement Systems Yearbook 2025 Volume vol. 32 Issue No 3 Authors Arikkatt, Antony Jose ; Janulewicz, Karol Adam ; Bartnik, Andrzej ; Fiedorowicz, Henryk ; Wachulak, Przemysław Affiliation Arikkatt, Antony Jose : Institute of Optoelectronics, Military University of Technology, ul. Kaliskiego 2, 00-908 Warsaw, Poland ; Janulewicz, Karol Adam : Institute of Optoelectronics, Military University of Technology, ul. Kaliskiego 2, 00-908 Warsaw, Poland ; Bartnik, Andrzej : Institute of Optoelectronics, Military University of Technology, ul. Kaliskiego 2, 00-908 Warsaw, Poland ; Fiedorowicz, Henryk : Institute of Optoelectronics, Military University of Technology, ul. Kaliskiego 2, 00-908 Warsaw, Poland ; Wachulak, Przemysław : Institute of Optoelectronics, Military University of Technology, ul. Kaliskiego 2, 00-908 Warsaw, Poland Keywords optical coherence tomography ; X-ray coherence tomography ; nanometre resolution ; spectral modification ; metrology ; laser-plasma source ; extreme ultraviolet ; soft X-rays Divisions of PAS Nauki Techniczne Coverage 1-18 Publisher Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation Date 28.11.2025 Type Article Identifier DOI: 10.24425/mms.2023.155799